Skip to search formSkip to main contentSkip to account menu
DOI:10.1109/TED.2013.2265320 - Corpus ID: 31461151
@article{Khandelwal2013RobustSC, title={Robust Surface-Potential-Based Compact Model for GaN HEMT IC Design}, author={Sourabh Khandelwal and Chandan Yadav and Shantanu Agnihotri and Yogesh Singh Chauhan and Arnaud Curutchet and Thomas Zimmer and J-C. De Jaeger and Nicolas Defrance and Tor A. Fjeldly}, journal={IEEE Transactions on Electron Devices}, year={2013}, volume={60}, pages={3216-3222}, url={https://api.semanticscholar.org/CorpusID:31461151}}
- S. Khandelwal, C. Yadav, T. Fjeldly
- Published in IEEE Transactions on Electron… 18 June 2013
- Engineering, Physics
We present an accurate and robust surface-potential-based compact model for simulation of circuits designed with GaN-based high-electron mobility transistors (GaN HEMTs). An accurate analytical surface-potential calculation, which we developed, is used to develop the drain and gate current model. The model is in excellent agreement with experimental data for both drain and gate current in all regions of device operation. We show the correct physical behavior and mathematical robustness of the…
101 Citations
2
30
26
4
Figures and Tables from this paper
- figure 1
- figure 2
- figure 3
- figure 4
- figure 5
- figure 6
- figure 7
- table I
101 Citations
- S. AgnihotriSudip GhoshA. DasguptaY. ChauhanS. Khandelwal
- 2013
Engineering, Physics
2013 IEEE Asia Pacific Conference on Postgraduate…
In this work a surface potential based compact model is presented for GaN material based High Electron Mobility Transistors. We have developed model for charges, drain current and gd (output…
- 7
- Naveen KarumuriGourab DuttaN. DasguptaA. DasGupta
- 2016
Engineering, Physics
IEEE Transactions on Electron Devices
A physics-based simple and accurate compact model of drain current for GaN-based high electron mobility transistors (HEMTs) is presented. The model is developed using analytical relations for charges…
- 22
- Sudip GhoshA. DasguptaS. KhandelwalS. AgnihotriY. Chauhan
- 2015
Engineering, Physics
IEEE Transactions on Electron Devices
In this paper, the gate current in AlGaN/GaN high-electron mobility transistors is modeled analytically in a surface potential-based compact model. Thermionic emission and Poole-Frenkel emission are…
- 43
- Liu JunYu ZhipingS. Lingling
- 2014
Engineering, Physics
A complete and accurate surface potential based large-signal model for compound semiconductor HEMTs is presented. A surface potential equation resembling the one used in conventional MOSFET models is…
- 2
- J. Liu 刘Zhiping 志平 Yu 余L. Sun 孙
- 2014
Engineering, Physics
A complete and accurate surface potential based large-signal model for compound semiconductor HEMTs is presented. A surface potential equation resembling the one used in conventional MOSFET models is…
- Jie WangZhanfei Chen S. Decoutere
- 2020
Engineering, Physics
IEEE Transactions on Electron Devices
The gate leakage current of p-GaN gate HEMTs is modeled based on surface potential calculations. The model accurately describes the bias and temperature dependence of the gate leakage. Thermionic…
- 7
- PDF
- F. JazaeriJ. Sallese
- 2019
Engineering, Physics
IEEE Transactions on Electron Devices
This paper presents a design-oriented charge-based model for dc operation of AlGaAs/GaAs and AlGaN/GaN-based high-mobility field-effect transistors. The intrinsic model is physics-based and does not…
- 38
- A. DasguptaSudip GhoshY. ChauhanS. Khandelwal
- 2015
Engineering, Physics
2015 IEEE International Conference on Electron…
In this paper, we aim to present the Advances Spice Model for High Electron Mobility Transistors (ASM-HEMT). The model is currently being considered in the second phase of industry standardization by…
- 36
- U. RadhakrishnaPilsoon ChoiD. Antoniadis
- 2019
Engineering, Physics
IEEE Transactions on Electron Devices
This paper illustrates the usefulness of the physics-based compact device models in investigating the impact of device behavioral nuances on the operation and performance of the circuits and systems.…
- 62
- PDF
- D. PandaT. Lenka
- 2017
Engineering, Physics
An enhancement mode p-GaN gate AlGaN/GaN HEMT is proposed and a physics based virtual source charge model with Landauer approach for electron transport has been developed using Verilog-A and…
- 15
...
...
17 References
- S. KhandelwalT. Fjeldly
- 2012
Engineering, Physics
2012 IEEE Compound Semiconductor Integrated…
We present a continuous surface-potential- based electro-thermal compact model suitable for the study of intermodulation distortion IMD in GaAs HEMT devices. We have developed a precise analytical…
- 8
- Highly Influential
- S. KhandelwalY. ChauhanT. Fjeldly
- 2012
Engineering, Physics
IEEE Transactions on Electron Devices
A surface potential (SP)-based analytical model for intrinsic charges in AlGaN/GaN high electron mobility transistor devices is presented. We have developed a precise analytical method to calculate…
- 129
- Highly Influential
- I. AngelovH. ZirathN. Rorsman
- 1992
Engineering, Physics
1992 IEEE Microwave Symposium Digest MTT-S
A novel large-signal model for HEMTs (high-electron-mobility transistors) capable of modeling the current-voltage characteristic and its derivatives, including the characteristic transconductance…
- 50
- Miao LiYan Wang
- 2008
Engineering, Physics
IEEE Transactions on Electron Devices
A threshold-voltage-based 2-D analytical model for the current-voltage characteristics of the AlGaN/GaN modulation-doped field-effect transistors (MODFETs) is presented. In this paper, the…
- 115
- A. KoudymovM. Shur A. Balistreri
- 2008
Physics, Engineering
A compact analytical model of short-channel AlGaN/GaN HEMTs in the presence of a current collapse is presented. The model is based on an experimentally established trapping mechanism at the gate…
- 39
- T. SadiF. Schwierz
- 2010
Engineering, Physics
2010 Proceedings of the European Solid State…
We present a newly developed continuous physics-based electrothermal I–V compact model suitable for the study intermodulation distortion in GaAs HEMTs and MESFETs. The model, which is an improvement…
- 9
- D. YanHai LuDongsheng CaoDunjun ChenRong ZhangYoudou Zheng
- 2010
Engineering, Physics
In this work, we include the polarization effect within the AlGaN barrier into calculation of the near-surface electrical field ES underneath the Schottky contact metal which determines the…
- 128
- Yunshen LongYong-xin GuoZheng Zhong
- 2012
Engineering, Physics
IEEE Transactions on Microwave Theory and…
A highly accurate method of building a large-signal modeling approach considering dispersive effect of field-effect transistors is presented, and the validity of the proposed technology-independent approach has been verified by both GaAs and GaN devices.
- 18
- J. JohF. GaoT. PalaciosJ. Alamo
- 2009
Engineering, Physics
2009 Reliability of Compound Semiconductors…
- 106
- PDF
- R. PengellyS. WoodJ. MilliganS. T. SheppardW. Pribble
- 2012
Engineering, Physics
IEEE Transactions on Microwave Theory and…
Examples of broadband amplifiers, as well as several of the main areas of high-efficiency amplifier design-notably Class-D, Class-E, class-F, and Class-J approaches, Doherty PAs, envelope-tracking techniques, and Chireix outphasing are described.
- 846
- PDF
...
...
Related Papers
Showing 1 through 3 of 0 Related Papers
Fig. 4. Setup of Gummel symmetry test for Ids model. Vx is varied from −1 to 1 V and Ids and its derivatives with respect to Vx (up to third order) are observed for multiple Vgs values. Top plot shows Ids versus Vx…
Published in IEEE Transactions on Electron Devices 2013
Robust Surface-Potential-Based Compact Model for GaN HEMT IC Design
S. KhandelwalC. Yadav T. Fjeldly
Figure 4 of 8