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@article{Khandelwal2013RobustSC, title={Robust Surface-Potential-Based Compact Model for GaN HEMT IC Design}, author={Sourabh Khandelwal and Chandan Yadav and Shantanu Agnihotri and Yogesh Singh Chauhan and Arnaud Curutchet and Thomas Zimmer and J-C. De Jaeger and Nicolas Defrance and Tor A. Fjeldly}, journal={IEEE Transactions on Electron Devices}, year={2013}, volume={60}, pages={3216-3222}, url={https://api.semanticscholar.org/CorpusID:31461151}}
  • S. Khandelwal, C. Yadav, T. Fjeldly
  • Published in IEEE Transactions on Electron… 18 June 2013
  • Engineering, Physics

We present an accurate and robust surface-potential-based compact model for simulation of circuits designed with GaN-based high-electron mobility transistors (GaN HEMTs). An accurate analytical surface-potential calculation, which we developed, is used to develop the drain and gate current model. The model is in excellent agreement with experimental data for both drain and gate current in all regions of device operation. We show the correct physical behavior and mathematical robustness of the…

101 Citations

Highly Influential Citations

2

Background Citations

30

Methods Citations

26

Results Citations

4

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101 Citations

A surface potential based model for GaN HEMTs
    S. AgnihotriSudip GhoshA. DasguptaY. ChauhanS. Khandelwal

    Engineering, Physics

    2013 IEEE Asia Pacific Conference on Postgraduate…

  • 2013

In this work a surface potential based compact model is presented for GaN material based High Electron Mobility Transistors. We have developed model for charges, drain current and gd (output

  • 7
A Compact Model of Drain Current for GaN HEMTs Based on 2-DEG Charge Linearization
    Naveen KarumuriGourab DuttaN. DasguptaA. DasGupta

    Engineering, Physics

    IEEE Transactions on Electron Devices

  • 2016

A physics-based simple and accurate compact model of drain current for GaN-based high electron mobility transistors (HEMTs) is presented. The model is developed using analytical relations for charges

  • 22
Surface-Potential-Based Compact Modeling of Gate Current in AlGaN/GaN HEMTs
    Sudip GhoshA. DasguptaS. KhandelwalS. AgnihotriY. Chauhan

    Engineering, Physics

    IEEE Transactions on Electron Devices

  • 2015

In this paper, the gate current in AlGaN/GaN high-electron mobility transistors is modeled analytically in a surface potential-based compact model. Thermionic emission and Poole-Frenkel emission are

  • 43
A complete and accurate surface-potential based large-signal model for compound semiconductor HEMTs
    Liu JunYu ZhipingS. Lingling

    Engineering, Physics

  • 2014

A complete and accurate surface potential based large-signal model for compound semiconductor HEMTs is presented. A surface potential equation resembling the one used in conventional MOSFET models is

  • 2
A complete and accurate surface-potential based large-signal model for compound semiconductor HEMTs
    J. Liu 刘Zhiping 志平 Yu 余L. Sun 孙

    Engineering, Physics

  • 2014

A complete and accurate surface potential based large-signal model for compound semiconductor HEMTs is presented. A surface potential equation resembling the one used in conventional MOSFET models is

Surface-Potential-Based Compact Model for the Gate Current of p-GaN Gate HEMTs
    Jie WangZhanfei Chen S. Decoutere

    Engineering, Physics

    IEEE Transactions on Electron Devices

  • 2020

The gate leakage current of p-GaN gate HEMTs is modeled based on surface potential calculations. The model accurately describes the bias and temperature dependence of the gate leakage. Thermionic

  • 7
  • PDF
Charge-Based EPFL HEMT Model
    F. JazaeriJ. Sallese

    Engineering, Physics

    IEEE Transactions on Electron Devices

  • 2019

This paper presents a design-oriented charge-based model for dc operation of AlGaAs/GaAs and AlGaN/GaN-based high-mobility field-effect transistors. The intrinsic model is physics-based and does not

  • 38
ASM-HEMT: Compact model for GaN HEMTs
    A. DasguptaSudip GhoshY. ChauhanS. Khandelwal

    Engineering, Physics

    2015 IEEE International Conference on Electron…

  • 2015

In this paper, we aim to present the Advances Spice Model for High Electron Mobility Transistors (ASM-HEMT). The model is currently being considered in the second phase of industry standardization by

  • 36
Facilitation of GaN-Based RF- and HV-Circuit Designs Using MVS-GaN HEMT Compact Model
    U. RadhakrishnaPilsoon ChoiD. Antoniadis

    Engineering, Physics

    IEEE Transactions on Electron Devices

  • 2019

This paper illustrates the usefulness of the physics-based compact device models in investigating the impact of device behavioral nuances on the operation and performance of the circuits and systems.

  • 62
  • PDF
Modeling and simulation of enhancement mode p-GaN Gate AlGaN/GaN HEMT for RF circuit switch applications
    D. PandaT. Lenka

    Engineering, Physics

  • 2017

An enhancement mode p-GaN gate AlGaN/GaN HEMT is proposed and a physics based virtual source charge model with Landauer approach for electron transport has been developed using Verilog-A and

  • 15

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17 References

A Surface-Potential-Based Compact Model for Study of Non-Linearities in AlGaAs/GaAs HEMTs
    S. KhandelwalT. Fjeldly

    Engineering, Physics

    2012 IEEE Compound Semiconductor Integrated…

  • 2012

We present a continuous surface-potential- based electro-thermal compact model suitable for the study of intermodulation distortion IMD in GaAs HEMT devices. We have developed a precise analytical

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  • Highly Influential
Analytical Modeling of Surface-Potential and Intrinsic Charges in AlGaN/GaN HEMT Devices
    S. KhandelwalY. ChauhanT. Fjeldly

    Engineering, Physics

    IEEE Transactions on Electron Devices

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A surface potential (SP)-based analytical model for intrinsic charges in AlGaN/GaN high electron mobility transistor devices is presented. We have developed a precise analytical method to calculate

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  • Highly Influential
A new empirical nonlinear model for HEMT-devices
    I. AngelovH. ZirathN. Rorsman

    Engineering, Physics

    1992 IEEE Microwave Symposium Digest MTT-S

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A novel large-signal model for HEMTs (high-electron-mobility transistors) capable of modeling the current-voltage characteristic and its derivatives, including the characteristic transconductance

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2-D Analytical Model for Current–Voltage Characteristics and Transconductance of AlGaN/GaN MODFETs
    Miao LiYan Wang

    Engineering, Physics

    IEEE Transactions on Electron Devices

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A threshold-voltage-based 2-D analytical model for the current-voltage characteristics of the AlGaN/GaN modulation-doped field-effect transistors (MODFETs) is presented. In this paper, the

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Analytical HFET $I$ – $V$ Model in Presence of Current Collapse
    A. KoudymovM. Shur A. Balistreri

    Physics, Engineering

  • 2008

A compact analytical model of short-channel AlGaN/GaN HEMTs in the presence of a current collapse is presented. The model is based on an experimentally established trapping mechanism at the gate

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A continuous physics-based electrothermal compact model for the study of non-linearities in III–V HEMTs
    T. SadiF. Schwierz

    Engineering, Physics

    2010 Proceedings of the European Solid State…

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We present a newly developed continuous physics-based electrothermal I–V compact model suitable for the study intermodulation distortion in GaAs HEMTs and MESFETs. The model, which is an improvement

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On the reverse gate leakage current of AlGaN/GaN high electron mobility transistors
    D. YanHai LuDongsheng CaoDunjun ChenRong ZhangYoudou Zheng

    Engineering, Physics

  • 2010

In this work, we include the polarization effect within the AlGaN barrier into calculation of the near-surface electrical field ES underneath the Schottky contact metal which determines the

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A 3-D Table-Based Method for Non-Quasi-Static Microwave FET Devices Modeling
    Yunshen LongYong-xin GuoZheng Zhong

    Engineering, Physics

    IEEE Transactions on Microwave Theory and…

  • 2012

A highly accurate method of building a large-signal modeling approach considering dispersive effect of field-effect transistors is presented, and the validity of the proposed technology-independent approach has been verified by both GaAs and GaN devices.

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A model for the critical voltage for electrical degradation of GaN high electron mobility transistors
    J. JohF. GaoT. PalaciosJ. Alamo

    Engineering, Physics

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A Review of GaN on SiC High Electron-Mobility Power Transistors and MMICs
    R. PengellyS. WoodJ. MilliganS. T. SheppardW. Pribble

    Engineering, Physics

    IEEE Transactions on Microwave Theory and…

  • 2012

Examples of broadband amplifiers, as well as several of the main areas of high-efficiency amplifier design-notably Class-D, Class-E, class-F, and Class-J approaches, Doherty PAs, envelope-tracking techniques, and Chireix outphasing are described.

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    Figure 4 from Robust Surface-Potential-Based Compact Model for GaN HEMT IC Design | Semantic Scholar (2025)
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